water mark wafer

PDF | Watermarks have long been known to occur when silicon is exposed after HF wet processing, particularly where patt...

water mark wafer

PDF | Watermarks have long been known to occur when silicon is exposed after HF wet processing, particularly where patterns include ...,By using the equipment into which this drying system was introduced, we evaluated water marks on wafer surface when the oxygen concentration near wafer ...

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water mark wafer 相關參考資料
(PDF) Upside-Down Residual Sessile Droplet: Watermarks on ...

PDF | On Jan 1, 2015, N. Belmiloud and others published Upside-Down Residual Sessile Droplet: Watermarks on Wafers Backside.

https://www.researchgate.net

(PDF) Wafer drying defects: Mechanisms and control

PDF | Watermarks have long been known to occur when silicon is exposed after HF wet processing, particularly where patterns include ...

https://www.researchgate.net

Cleaning Technology in Semiconductor Device Manufacturing ...

By using the equipment into which this drying system was introduced, we evaluated water marks on wafer surface when the oxygen concentration near wafer ...

https://books.google.com.tw

Effective Rinse Aiming at Water-Mark-free Drying ... - CiteSeerX

Keywords: wet cleaning, single wafer cleaning, wafer drying, water mark, HF process. ... formation is the dissolution of silicon from the wafer surface into the rinse ...

http://citeseerx.ist.psu.edu

Identification and removal of defects on silicon wafer ...

Watermark generation during wafer cleaning, which is the most repeated step in IC manufacturing, was investigated. Watermark formed during the HF last clea.

https://ieeexplore.ieee.org

Insights into Watermark Formation and Control ... - CiteSeerX

Keywords: Watermarks, wafer drying, hydrophobic silicon, DHF last. Introduction. Watermarks have long been known to occur when hydrophobic silicon is ...

http://citeseerx.ist.psu.edu

Method of reducing the formation of watermarks on ...

A method for reducing the formation of watermarks includes providing a semiconductor wafer and contacting the semiconductor wafer with a ...

http://www.freepatentsonline.c

Relationship between Atmospheric Humidity and Watermark ...

It is known that watermarks are easily generated when a silicon hydrophobic ... Atmospheric Humidity and Watermark Formation in IPA Dry of Si Wafer after HF ...

https://www.scientific.net

US6074935A - Method of reducing the formation of ...

A method for reducing the formation of watermarks includes providing a semiconductor wafer and contacting the semiconductor wafer with a solution containing ...

https://patents.google.com