sram repair
Embedded SRAM test and repair moves on-chip. By Anthony Cataldo, EE Times July 11, 2001 (2:15 p.m. EST) URL: http://www.eetimes.com/story/ ... ,Except of the spare bit in each SRAM word, a CAM is also served as the redundant resource. Figure 2(b) shows the architecture of the CAM used to repair faulty ...
| 相關軟體 Construct 2 資訊 | |
|---|---|
 sram repair 相關參考資料
Built-in self-repair (BISR) technique widely Used to repair ...
For such purpose, memory designers usually employ redundancy repair logic ... ECC memory (which can be either SRAM or DRAM) includes special circuitry to ... http://www.ijcse.net Embedded SRAM test and repair moves on-chip
Embedded SRAM test and repair moves on-chip. By Anthony Cataldo, EE Times July 11, 2001 (2:15 p.m. EST) URL: http://www.eetimes.com/story/ ... https://www.design-reuse.com Istccstic 2009 (cistc)
Except of the spare bit in each SRAM word, a CAM is also served as the redundant resource. Figure 2(b) shows the architecture of the CAM used to repair faulty ... https://books.google.com.tw Memory Repair
➢Repair is one popular technique for memory yield improvement. ➢Memory repair consists of three basic steps. ➢Test ... Layout view of the repairable SRAM. http://www.ee.ncu.edu.tw SRAM redundancy insertion - SlideShare
SRAM Redundancy - Basics• Memories are more prone to defects then other sections of SOC• SRAM Repair – defect SRAM bits are repaired ... https://www.slideshare.net SRAM测试总结- 知乎
在40nm SoC产品Sram一般在20Mbits左右，当工艺发展到28nm ... 理论上如果SRAM支持redundancy repair + ECC，在测试的时候做到以下几点：. https://zhuanlan.zhihu.com SRAM的檢測與修復整合性方案-START - 記憶體測試與修復 ...
iSTART-TEK's START (SRAM Built-in Testing And Repairing Technology) solution is tool-based solution for generating logics of BIST and BISR and inserting ... http://www.istart-tek.com START (SRAM Built-in Testing And Repairing Technology ...
iSTART-TEK's START (SRAM Built-in Testing And Repairing Technology) solution is tool-based solution for generating logics of BIST and BISR and inserting ... http://www.istart-tek.com 白安鵬--半導體積體電路測試技術部落格: D.再談記憶體測試
以6T的SRAM為例，它的失效密度為一般邏輯電路的2倍。 ... 備援記憶體細胞加雷射修補(Redundancy & Laser Repair)，這種方式對良率的提昇相當 ... http://ictesting-tom.blogspot. |