neighborhood pattern sensitive fault
Abstract: With the increase in memory density, neighborhood pattern sensitive faults (NPSFs) are not only an important fault model for DRAMs but will also become so for SRAMs. NPSFs can be considered generalized versions of simple-cell faults and two-cell,Efficient neighborhood pattern-sensitive fault test algorithms for semiconductor memories. Abstract: We present two memory test algorithms for neighborhood pattern sensitive faults (NPSFs), including static NPSF (SNPSF), passive NPSF (PNPSF) and active NP
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 neighborhood pattern sensitive fault 相關參考資料
Neighborhood pattern-sensitive fault testing and ... - IEEE Xplore
Abstract—The authors present test algorithms for go/no-go and diagnostic test of memories, covering neighborhood pattern-sen- sitive faults (NPSFs). The proposed test algorithms are March based, which... http://ieeexplore.ieee.org Disturb neighborhood pattern sensitive fault - IEEE Conference ...
Abstract: With the increase in memory density, neighborhood pattern sensitive faults (NPSFs) are not only an important fault model for DRAMs but will also become so for SRAMs. NPSFs can be considered ... http://ieeexplore.ieee.org Efficient neighborhood pattern-sensitive fault test algorithms for ...
Efficient neighborhood pattern-sensitive fault test algorithms for semiconductor memories. Abstract: We present two memory test algorithms for neighborhood pattern sensitive faults (NPSFs), including ... http://ieeexplore.ieee.org Efficient neighborhood pattern-sensitive fault test ... - IEEE Xplore
Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for. Semiconductor Memories. Kuo-Liang Cheng, Ming-Fu Tsai, and Cheng-Wen Wu. Department of Electrical Engineering. National Tsing Hua Un... http://ieeexplore.ieee.org dynamic neighborhood pattern-sensitive faults in random-access ...
Abstract. The paper presents a study on dynamic faults in random access memories. A new fault model of dynamic neighborhood pattern-sensitive faults is presented. This model is described by 448 fault ... http://www12.tuiasi.ro Chapter 3 RAM Testing
EE, National Central University. Tests for NPSFs. • Neighborhood Pattern Sensitive Faults (NPSFs). − Type 1 and type 2 neighborhoods. • The physical layout of the RAM core and the technology determine... http://www.ee.ncu.edu.tw Neighborhood pattern-sensitive fault testing and ... - ACM Digital Library
The authors present test algorithms for go/no-go and diagnostic test of memories, covering neighborhood pattern-sensitive faults (NPSFs). The proposed test algorithms are March based, which have linea... https://dl.acm.org |