coupling fault
Coupling fault. Neighborhood Pattern Sensitive fault. 12. Stuck-at Faults. Condition: For each cell, must read a 0 and a 1. 13. Transition Faults. Cell fails to make ... ,This article presents results fundamental to the problem of detecting coupling faults in random access memories (RAMs). Good and faulty memories are ...
| 相關軟體 Construct 2 資訊 | |
|---|---|
 coupling fault 相關參考資料
4 - nptel
Coupling fault, as the name suggests, implies deviation from normal behavior of a cell because of coupling with others. As there can be exponential number of ... https://nptel.ac.in Coupling Fault
Coupling fault. Neighborhood Pattern Sensitive fault. 12. Stuck-at Faults. Condition: For each cell, must read a 0 and a 1. 13. Transition Faults. Cell fails to make ... http://homepages.cae.wisc.edu Detection of coupling faults in RAMs | SpringerLink
This article presents results fundamental to the problem of detecting coupling faults in random access memories (RAMs). Good and faulty memories are ... https://link.springer.com Diagnosis and repair of memory with coupling faults - IEEE Journals ...
These procedures, however, have been restricted to repair stuck-at faults. The authors examine both diagnosis and repair of coupling faults in RAMs utilizing ... https://ieeexplore.ieee.org March Test Algorithm for 3-Coupling Faults in ... - Semantic Scholar
Abstract: - A new efficient march test algorithm for detecting 3-coupling faults in Random Access Memories is given in this paper. To reduce the length of the test ... https://pdfs.semanticscholar.o Memory fault models and testing | EDN
In the widely used coupling fault model it is assumed that any “two” cells can be coupled together leading to irregular behavior in these two ... https://www.edn.com MEMORY TESTING
Taxonomy of Functional Memory Faults. Fault Primitive. C: Number of Cells. O: Number of Operations. C=1. Single Cell Fault. C>1. Coupling Fault. C=2. http://www.pld.ttu.ee Memory Testing Fault modeling
An idempotent coupling fault can be thought of p. p g g as an S/R-type flip-flop with an OR-gate in the. Set or Reset line, as depicted in the following fig re S is the ... http://www.ee.ncu.edu.tw 白安鵬--半導體積體電路測試技術部落格: 九月2010
耦合失效Coupling Fault(CF)，牽涉到兩個記憶體細胞，它們之間的交互作用。一個細胞(Cell i)會因另一個細胞(Cell j)的影響而失效。細胞j稱為主動 ... http://ictesting-tom.blogspot. |