atpg at speed
Focus on a number of combinational and sequential ATPG techniques. Deterministic ATPG ...... Benefit: true at-speed testing of intra-clock-domain delay faults. , SOC设计中的at-speed ATPG. 摘要：SOC(片上系统集成)已成为VLSI(超大规模集成电路)设计的主流方法。它由于设计周期短，设计可重用性好， ...
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 atpg at speed 相關參考資料
Automatic test pattern generation - Wikipedia
ATPG is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test ... https://en.wikipedia.org Lecture Slides for ATPG - IC-Test Lab, NCUE, Taiwan
Focus on a number of combinational and sequential ATPG techniques. Deterministic ATPG ...... Benefit: true at-speed testing of intra-clock-domain delay faults. http://testlab.ncue.edu.tw SOC设计中的 at-speed ATPG_李海东_新浪博客
SOC设计中的at-speed ATPG. 摘要：SOC(片上系统集成)已成为VLSI(超大规模集成电路)设计的主流方法。它由于设计周期短，设计可重用性好， ... http://blog.sina.com.cn At-Speed and Advanced Fault Models for Achieving ... - EDN
At-speed scan test is a common practice in most 130 nm and smaller designs ... Keywords: at-speed test, timing-aware ATPG, on-chip PLL, small delay defect, ... https://www.edn.com (PDF) Timing-Aware ATPG for High Quality At-speed Testing ...
PDF | In this paper, a new ATPG methodology is proposed to improve the quality of test sets generated for detecting delay defects. This is achieved by... | Find ... https://www.researchgate.net At-speed scan insertion and automatic test pattern generation ...
ATPG to detect at-speed defects. Another model called path-delay fault model is also created for speed-gradinglbinning and I10 timing characterization on scan- ... https://pdfs.semanticscholar.o At-speed testing made easy | EE Times
The ATPG tool analyzes the paths and, when it determines that a path is a real functional path, it generates patterns to test it. When the ATPG fault model is set to path delay, the fault list contai... https://www.eetimes.com At-speed Testing of SOC ICs
For at-speed scan testing, multicycle paths should be avoided (all timing paths fit into one clock cycle). This requirement is driven by the current ATPG tools which assume that all paths are single c... https://www.date-conference.co (PDF) High-Frequency, At-Speed Scan Testing - ResearchGate
The authors describe new strategies where at-speed scan tests can be applied with internal PLL. They present techniques for optimizing ATPG ... https://www.researchgate.net Tessent FastScan - Mentor Graphics
Tessent FastScan's at-speed tests include transition, multiple detect ... Reduces run time with no effect on coverage or pattern count using distributed ATPG. https://www.mentor.com |