automatic test pattern generation
APT是一个程序开发语言，Automatic Test Pattern Generation(ATPG)自动测试向量生成是在半导体电器测试中使用的测试图形向量由程序自动生成的过程。测试向量 ... ,Automatic Test Pattern Generation, or ATPG, is a process used in semiconductor electrical testing wherein the vectors or input patterns required to check a ...
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 automatic test pattern generation 相關參考資料
ATPG - 維基百科，自由的百科全書 - Wikipedia
自動測試圖樣產生（英語：Automatic test pattern generation, ATPG）系統是一種 ... 和序向邏輯電路（Sequential logic）的電路測試，必須要使用不同的ATPG 方法。 https://zh.wikipedia.org ATPG_百度百科
APT是一个程序开发语言，Automatic Test Pattern Generation(ATPG)自动测试向量生成是在半导体电器测试中使用的测试图形向量由程序自动生成的过程。测试向量 ... https://baike.baidu.com Automatic Test Pattern Generation (ATPG) - EESemi.com
Automatic Test Pattern Generation, or ATPG, is a process used in semiconductor electrical testing wherein the vectors or input patterns required to check a ... https://www.eesemi.com Automatic test pattern generation (ATPG) Research Papers ...
View Automatic test pattern generation (ATPG) Research Papers on Academia.edu for free. http://www.academia.edu Automatic Test Pattern Generation - ResearchGate
Download Citation | Automatic Test Pattern Generation | In this chapter we focus our attention to the ATPG (automatic test pattern generator). We also examine ... https://www.researchgate.net Automatic Test Pattern Generation - Semiconductor Engineering
Description. ATPG (Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an EDA method/technology used to find an input or test ... https://semiengineering.com Automatic test pattern generation - Wikipedia
ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when ... https://en.wikipedia.org DFT的歷史教了我們什麼？ - EDN Taiwan
接下來的測試範例在10年後出現，當掃描基於單獨的自動測試圖樣產生(Automatic test pattern generation，ATPG)，再也無法跟上不斷成長的設計 ... https://www.edntaiwan.com 超大型積體電路測試 - 清華大學電機系 - 國立清華大學
Automatic Test Pattern Generation. General ATPG Flow. • ATPG (Automatic Test Pattern Generation). – Generate a set of vectors for a set of target faults. B i fl. https://www.ee.nthu.edu.tw |